Tian Wang, Yang Chen, Meina Qiao, Hichem Snoussi. A fast and robust convolutional neural network-based defect detection model in product quality control.
International Journal of Advanced Manufacturing Technology, Springer Verlag, 2018, 94 (9-12), pp.3465-3471.
⟨10.1007/s00170-017-0882-0⟩.
⟨hal-03320589⟩