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Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

Sobhe Hamyeh 1, 2, 3 Rabih Tauk 2 Pierre-Michel Adam 1 Michel Kazan 3
1 L2n - Lumière, nanomatériaux et nanotechnologies
ICD - Institut Charles Delaunay
2 LU - Lebanese University [Beirut]
3 AUB - American University of Beirut [Beyrouth]
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https://hal-utt.archives-ouvertes.fr/hal-02980976
Contributor : Pierre-Michel Adam Connect in order to contact the contributor
Submitted on : Tuesday, October 27, 2020 - 5:00:06 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:18 AM

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Sobhe Hamyeh, Rabih Tauk, Pierre-Michel Adam, Michel Kazan. Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon. Journal of Applied Physics, American Institute of Physics, 2020, 128 (9), pp.095105. ⟨10.1063/5.0015577⟩. ⟨hal-02980976⟩

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