Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

Sobhe Hamyeh; Rabih Tauk; Pierre-Michel Adam; Michel Kazan

doi:10.1063/5.0015577

Journal articles

Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

Sobhe Hamyeh ^{1, 2, 3} Rabih Tauk ² Pierre-Michel Adam ¹ Michel Kazan ³

1 L2n - Lumière, nanomatériaux et nanotechnologies

ICD - Institut Charles Delaunay

2 LU - Lebanese University [Beirut]

3 AUB - American University of Beirut [Beyrouth]

Document type :

Journal articles

Domain :

Physics [physics]

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https://hal-utt.archives-ouvertes.fr/hal-02980976
Contributor : Pierre-Michel Adam <>
Submitted on : Tuesday, October 27, 2020 - 5:00:06 PM
Last modification on : Wednesday, October 28, 2020 - 3:25:47 AM

Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

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Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

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