Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

Sobhe Hamyeh; Rabih Tauk; Pierre-Michel Adam; Michel Kazan

doi:10.1063/5.0015577

Journal Articles Journal of Applied Physics Year : 2020

Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

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Sobhe Hamyeh

Function : Author

Lumière, nanomatériaux et nanotechnologies

Lebanese University [Beirut]

American University of Beirut [Beyrouth]

Rabih Tauk

Function : Author

Lebanese University [Beirut]

Pierre-Michel Adam

Function : Author

Lumière, nanomatériaux et nanotechnologies

Michel Kazan

Function : Author

American University of Beirut [Beyrouth]

Domains

Physics [physics]

pierre-michel adam : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02980976

Submitted on : Tuesday, October 27, 2020-5:00:06 PM

Last modification on : Sunday, June 26, 2022-4:46:47 AM

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hal-02980976 , version 1 (27-10-2020)

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HAL Id : hal-02980976 , version 1
DOI : 10.1063/5.0015577

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Sobhe Hamyeh, Rabih Tauk, Pierre-Michel Adam, Michel Kazan. Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon. Journal of Applied Physics, 2020, 128 (9), pp.095105. ⟨10.1063/5.0015577⟩. ⟨hal-02980976⟩

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Mid-IR photothermal measurement of substantial heat transport by surface waves of polar amorphous films supported on silicon

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