 |
Journal articles
A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies
https://hal-utt.archives-ouvertes.fr/hal-02886723
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Wednesday, July 1, 2020 - 5:22:05 PM
Last modification on : Sunday, June 26, 2022 - 4:49:22 AM
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Wednesday, July 1, 2020 - 5:22:05 PM
Last modification on : Sunday, June 26, 2022 - 4:49:22 AM