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A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies

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https://hal-utt.archives-ouvertes.fr/hal-02886723
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Wednesday, July 1, 2020 - 5:22:05 PM
Last modification on : Friday, September 25, 2020 - 7:00:04 PM

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Jian Lu, Delphine Retraint. A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies. The Journal of Strain Analysis for Engineering Design, 1998, 33 (2), pp.127-136. ⟨10.1243/0309324981512869⟩. ⟨hal-02886723⟩

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