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Journal articles
A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies
https://hal-utt.archives-ouvertes.fr/hal-02886723
Contributor : Jean-Baptiste Vu Van Connect in order to contact the contributor
Submitted on : Wednesday, July 1, 2020 - 5:22:05 PM
Last modification on : Wednesday, September 15, 2021 - 3:09:36 PM
Contributor : Jean-Baptiste Vu Van Connect in order to contact the contributor
Submitted on : Wednesday, July 1, 2020 - 5:22:05 PM
Last modification on : Wednesday, September 15, 2021 - 3:09:36 PM
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