A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies

Jian Lu; Delphine Retraint

doi:10.1243/0309324981512869

Journal articles

A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies

Jian Lu ¹ Delphine Retraint ¹

1 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée

ICD - Institut Charles Delaunay

Document type :

Journal articles

Domain :

Engineering Sciences [physics]

Complete list of metadatas

https://hal-utt.archives-ouvertes.fr/hal-02886723
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Wednesday, July 1, 2020 - 5:22:05 PM
Last modification on : Friday, September 25, 2020 - 7:00:04 PM

A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies

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A Review of Recent Developments and Applications in the Field of X-Ray Diffraction for Residual Stress Studies

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