Characterization of the mechanical behaviour of materials at a microscopic scale : development of a optical full-field measurement method

R. Moulard; René Rotinat; F. Pierron; Gilles Lerondel

Conference papers

Characterization of the mechanical behaviour of materials at a microscopic scale : development of a optical full-field measurement method

R. Moulard René Rotinat ¹ F. Pierron ² Gilles Lerondel ³

1 MSMP - Mechanics surfaces and materials processing

2 µVIS X-ray Imaging Centre - Faculty of Engineering and the Environment

3 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique

ICD - Institut Charles Delaunay

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Optics / Photonic

Complete list of metadatas

https://hal-utt.archives-ouvertes.fr/hal-02866253
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Friday, June 12, 2020 - 12:53:43 PM
Last modification on : Friday, July 17, 2020 - 2:59:04 PM

Characterization of the mechanical behaviour of materials at a microscopic scale : development of a optical full-field measurement method

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Characterization of the mechanical behaviour of materials at a microscopic scale : development of a optical full-field measurement method

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