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Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation

Abstract : Porous-silicon reflectance has been determined over a large energy range, from 1 eV to 16 eV, by combining a NIR/visible/UV spectrometer with a new VUV light source as laser-harmonic radiation. The porous-silicon dielectric function was deduced from reflectance measurements by Kramers–Kronig analysis. We point out that, for the first time, laser harmonics have been applied in the optical characterization of materials as a new and suitable alternative to synchrotron radiation.
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https://hal-utt.archives-ouvertes.fr/hal-02865976
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Submitted on : Friday, June 12, 2020 - 10:44:32 AM
Last modification on : Friday, June 12, 2020 - 10:44:33 AM

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F. de Filippo, C. de Lisio, P. Maddalena, Gilles Lerondel, T. Yao, et al.. Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation. Applied physics. A, Materials science & processing, Springer Verlag, 2001, 73 (6), pp.737-740. ⟨10.1007/s003390100908⟩. ⟨hal-02865976⟩

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