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Journal Articles Applied physics. A, Materials science & processing Year : 2001

Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation

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Abstract

Porous-silicon reflectance has been determined over a large energy range, from 1 eV to 16 eV, by combining a NIR/visible/UV spectrometer with a new VUV light source as laser-harmonic radiation. The porous-silicon dielectric function was deduced from reflectance measurements by Kramers–Kronig analysis. We point out that, for the first time, laser harmonics have been applied in the optical characterization of materials as a new and suitable alternative to synchrotron radiation.

Dates and versions

hal-02865976 , version 1 (12-06-2020)

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F. de Filippo, C. de Lisio, P. Maddalena, Gilles Lerondel, T. Yao, et al.. Determination of the dielectric function of porous silicon by high-order laser-harmonic radiation. Applied physics. A, Materials science & processing, 2001, 73 (6), pp.737-740. ⟨10.1007/s003390100908⟩. ⟨hal-02865976⟩
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