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An Eddy Current Parametric Model for Flaw Characterization

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Remy La
  • Function : Author
Bruno Benoist
  • Function : Author
Benoit de Barmon
  • Function : Author
Jacques Reuchet
  • Function : Author
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Dates and versions

hal-02861500 , version 1 (09-06-2020)

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  • HAL Id : hal-02861500 , version 1

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Remy La, Bruno Benoist, Benoit de Barmon, Régis Lengellé, Paul Gaillard, et al.. An Eddy Current Parametric Model for Flaw Characterization. 14th World Conference on Non Destructive Testing, Dec 1996, New Delhi, India. ⟨hal-02861500⟩
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