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An Eddy Current Parametric Model for Flaw Characterization

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https://hal-utt.archives-ouvertes.fr/hal-02861500
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, June 9, 2020 - 9:14:31 AM
Last modification on : Wednesday, June 10, 2020 - 5:35:02 AM

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  • HAL Id : hal-02861500, version 1

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Remy La, Bruno Benoist, Benoit de Barmon, Régis Lengellé, Paul Gaillard, et al.. An Eddy Current Parametric Model for Flaw Characterization. 14th World Conference on Non Destructive Testing, Dec 1996, New Delhi, India. ⟨hal-02861500⟩

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