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Book Sections Year : 2009

Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method

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Optics / Photonic

Jean-Baptiste VU VAN  : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02861424

Submitted on : Tuesday, June 9, 2020-6:25:18 AM

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hal-02861424 , version 1 (09-06-2020)

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  • HAL Id : hal-02861424 , version 1

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Alexandre Vial, Thierry Laroche. Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method. Bubendorff, J.-L., and F. H. Lei. Advanced Techniques and applications on scanning probe microscopy, Research Signpost, pp.23-46, 2009, 9788178953786. ⟨hal-02861424⟩

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