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Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method

Alexandre Vial 1 Thierry Laroche 2
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
2 FEMTO-ST - Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174)
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https://hal-utt.archives-ouvertes.fr/hal-02861424
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, June 9, 2020 - 6:25:18 AM
Last modification on : Wednesday, September 16, 2020 - 10:42:54 AM

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  • HAL Id : hal-02861424, version 1

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Alexandre Vial, Thierry Laroche. Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method. Bubendorff, J.-L., and F. H. Lei. Advanced Techniques and applications on scanning probe microscopy, Research Signpost, pp.23-46, 2009, 9788178953786. ⟨hal-02861424⟩

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