Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method - Archive ouverte HAL Access content directly
Book Sections Year : 2009

Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method

(1) , (2)
1
2

Domains

Engineering Sciences [physics] Optics / Photonic

Jean-Baptiste VU VAN  : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02861424

Submitted on : Tuesday, June 9, 2020-6:25:18 AM

Last modification on : Sunday, June 26, 2022-4:46:25 AM

Not file

Dates and versions

hal-02861424 , version 1 (09-06-2020)

Identifiers

  • HAL Id : hal-02861424 , version 1

Cite

Alexandre Vial, Thierry Laroche. Use of the critical points model as law of dispersion for the modeling of plasmonic structures using the FDTD method. Bubendorff, J.-L., and F. H. Lei. Advanced Techniques and applications on scanning probe microscopy, Research Signpost, pp.23-46, 2009, 9788178953786. ⟨hal-02861424⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

CNRS UNIV-FCOMTE UNIV-BM FEMTO-ST UNIV-BM-THESE UTT
21 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More