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Strain Localization monitored by Speckle Pattern Interferometry

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Engineering Sciences [physics]

Jean-Baptiste VU VAN  : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02615084

Submitted on : Friday, May 22, 2020-9:58:02 AM

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hal-02615084 , version 1 (22-05-2020)

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  • HAL Id : hal-02615084 , version 1

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Chengheri Bao, Léa Le Joncour, Manuel François. Strain Localization monitored by Speckle Pattern Interferometry. European Mechanics of Materials Conference (EMMC-14), Aug 2014, Gothenburg, Sweden. ⟨hal-02615084⟩

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