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Analysis of diffractometer misalignment with a 2D detector, application to X-ray stress analysis

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Conference papers
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https://hal-utt.archives-ouvertes.fr/hal-02615056
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Friday, May 22, 2020 - 9:17:04 AM
Last modification on : Saturday, May 23, 2020 - 3:22:15 AM

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  • HAL Id : hal-02615056, version 1

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Citation

Manuel Francois, Léa Le Joncour. Analysis of diffractometer misalignment with a 2D detector, application to X-ray stress analysis. 10th European Conference on Residual Stresses, ECRS-10, Sep 2018, Leuven, Belgium. ⟨hal-02615056⟩

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