Round robin of external samples for residual stress analyses by X-ray diffraction

Fabien Lefebvre; Eric Wasniewski; Thierry Bergey; A. Roth; Manuel François; Patrick Allain; P. Le-Bec; C. Fisher; Sophie Berveiller; Laurence Besnauld; L. Mermillod-Blondin; Yann Cheynet; Renaud Frappier; Guillaume Geandier; Marie-José Moya; F. Savrot

Conference papers

Round robin of external samples for residual stress analyses by X-ray diffraction

Fabien Lefebvre ¹ Eric Wasniewski ¹ Thierry Bergey ² A. Roth Manuel François ³ Patrick Allain P. Le-Bec ⁴ C. Fisher Sophie Berveiller ⁵ Laurence Besnauld L. Mermillod-Blondin Yann Cheynet Renaud Frappier Guillaume Geandier ⁶ Marie-José Moya F. Savrot

1 CETIM - CEntre Technique des Industries Mécaniques

2 ArianeGroup

3 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée

ICD - Institut Charles Delaunay

4 EDF R&D MMC - Matériaux et Mécanique des Composants

5 LEM3 - Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux

6 IJL - Institut Jean Lamour

Document type :

Conference papers

Domain :

Engineering Sciences [physics]

Complete list of metadata

https://hal-utt.archives-ouvertes.fr/hal-02615055
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Friday, May 22, 2020 - 9:14:06 AM
Last modification on : Friday, August 5, 2022 - 2:54:00 PM

Round robin of external samples for residual stress analyses by X-ray diffraction

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Round robin of external samples for residual stress analyses by X-ray diffraction

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