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Round robin of external samples for residual stress analyses by X-ray diffraction

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https://hal-utt.archives-ouvertes.fr/hal-02615055
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Friday, May 22, 2020 - 9:14:06 AM
Last modification on : Friday, July 17, 2020 - 2:58:25 PM

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  • HAL Id : hal-02615055, version 1

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Fabien Lefebvre, Eric Wasniewski, Thierry Bergey, A. Roth, Manuel Francois, et al.. Round robin of external samples for residual stress analyses by X-ray diffraction. 10th European Conference on Residual Stresses, ECRS-10, Sep 2018, Leuven, Belgium. ⟨hal-02615055⟩

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