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Round robin of external samples for residual stress analyses by X-ray diffraction

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Thierry Bergey
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A. Roth
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Patrick Allain
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C. Fisher
  • Function : Author
Laurence Besnauld
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L. Mermillod-Blondin
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Yann Cheynet
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Renaud Frappier
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Guillaume Geandier
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  • PersonId : 876999
Marie-José Moya
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F. Savrot
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Dates and versions

hal-02615055 , version 1 (22-05-2020)

Identifiers

  • HAL Id : hal-02615055 , version 1

Cite

Fabien Lefebvre, Eric Wasniewski, Thierry Bergey, A. Roth, Manuel François, et al.. Round robin of external samples for residual stress analyses by X-ray diffraction. 10th European Conference on Residual Stresses, ECRS-10, Sep 2018, Leuven, Belgium. ⟨hal-02615055⟩
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