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Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations

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Engineering Sciences [physics]

Jean-Baptiste VU VAN  : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02613799

Submitted on : Wednesday, May 20, 2020-1:27:45 PM

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hal-02613799 , version 1 (20-05-2020)

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  • HAL Id : hal-02613799 , version 1

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Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Aurélien Bruyant. Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations. 9th International Conference on Information Optics and Photonics CIOP 2017, Holography and related processing, Jul 2017, Harbin, China. ⟨hal-02613799⟩

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