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Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations

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https://hal-utt.archives-ouvertes.fr/hal-02613799
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Wednesday, May 20, 2020 - 1:27:45 PM
Last modification on : Thursday, May 21, 2020 - 1:37:49 AM

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  • HAL Id : hal-02613799, version 1

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Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel Francois, Aurélien Bruyant. Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations. 9th International Conference on Information Optics and Photonics CIOP 2017, Holography and related processing, Jul 2017, Harbin, China. ⟨hal-02613799⟩

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