Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations - Archive ouverte HAL Access content directly
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Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations

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hal-02613799 , version 1 (20-05-2020)

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  • HAL Id : hal-02613799 , version 1

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Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Aurélien Bruyant. Simultaneous 2D in-plane displacement field measurement using electronic speckle pattern interferometry (ESPI) with sinusoidal phase modulations. 9th International Conference on Information Optics and Photonics CIOP 2017, Holography and related processing, Jul 2017, Harbin, China. ⟨hal-02613799⟩

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