Porous surface statistical characterization via fluorescence correlation spectroscopy

Jerome Plain; Rodolphe Jaffiol; Gilles Lerondel; Pascal Royer

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Porous surface statistical characterization via fluorescence correlation spectroscopy

(1) , (1) , (1) , (1)

1

Jerome Plain

Function : Author
PersonId : 170662
IdHAL : jerome-plain
ORCID : 0000-0001-5806-9965
IdRef : 060364440

Laboratoire de Nanotechnologie et d'Instrumentation Optique

Rodolphe Jaffiol

Function : Author
PersonId : 926342

Laboratoire de Nanotechnologie et d'Instrumentation Optique

Gilles Lerondel

Function : Author
PersonId : 179313
IdHAL : gilles-lerondel
ORCID : 0000-0002-1942-3260
IdRef : 120689448

Laboratoire de Nanotechnologie et d'Instrumentation Optique

CV

Pascal Royer

Function : Author

Laboratoire de Nanotechnologie et d'Instrumentation Optique

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Materials Micro and nanotechnologies/Microelectronics

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Submitted on : Friday, April 3, 2020-7:53:01 AM

Last modification on : Friday, March 24, 2023-2:53:15 PM

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hal-02530476 , version 1 (03-04-2020)

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HAL Id : hal-02530476 , version 1

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Jerome Plain, Rodolphe Jaffiol, Gilles Lerondel, Pascal Royer. Porous surface statistical characterization via fluorescence correlation spectroscopy. Porous Semiconductors Science and Technology 2006, Mar 2006, Sitges, Spain. ⟨hal-02530476⟩

Porous surface statistical characterization via fluorescence correlation spectroscopy

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