Porous surface statistical characterization via fluorescence correlation spectroscopy - Archive ouverte HAL Access content directly
Conference Papers Year : 2007

Porous surface statistical characterization via fluorescence correlation spectroscopy

(1) , (1) , (1) , (1)
1

Domains

Engineering Sciences [physics] Materials Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

Jean-Baptiste VU VAN  : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02530475

Submitted on : Friday, April 3, 2020-7:49:00 AM

Last modification on : Sunday, June 26, 2022-4:45:56 AM

Not file

Dates and versions

hal-02530475 , version 1 (03-04-2020)

Identifiers

  • HAL Id : hal-02530475 , version 1

Cite

Jerome Plain, Rodolphe Jaffiol, Gilles Lerondel, Pascal Royer. Porous surface statistical characterization via fluorescence correlation spectroscopy. 5th International Conference on Porous Semiconductors - Science and Technology, Mar 2007, Sitges, Spain. ⟨hal-02530475⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

CNRS UTT
11 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More