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Porous surface statistical characterization via fluorescence correlation spectroscopy

Jerome Plain 1 Rodolphe Jaffiol 1 Gilles Lerondel 1 Pascal Royer 1
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
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Conference papers
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https://hal-utt.archives-ouvertes.fr/hal-02530475
Contributor : Jean-Baptiste Vu Van Connect in order to contact the contributor
Submitted on : Friday, April 3, 2020 - 7:49:00 AM
Last modification on : Wednesday, September 15, 2021 - 3:03:55 PM

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  • HAL Id : hal-02530475, version 1

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Jerome Plain, Rodolphe Jaffiol, Gilles Lerondel, Pascal Royer. Porous surface statistical characterization via fluorescence correlation spectroscopy. 5th International Conference on Porous Semiconductors - Science and Technology, Mar 2007, Sitges, Spain. ⟨hal-02530475⟩

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