Analysis of the vibrational, structural and optical properties of SiC/Ge/Si heterostructures by means of infrared reflectivity: effect of Ge amount at the SiC/Si interface - Université de technologie de Troyes Accéder directement au contenu
Communication Dans Un Congrès Année : 2009

Analysis of the vibrational, structural and optical properties of SiC/Ge/Si heterostructures by means of infrared reflectivity: effect of Ge amount at the SiC/Si interface

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Optique / photonique

Jean-Baptiste VU VAN  : Connectez-vous pour contacter le contributeur

https://utt.hal.science/hal-02526142

Soumis le : mardi 31 mars 2020-13:27:32

Dernière modification le : vendredi 12 janvier 2024-16:46:42

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hal-02526142 , version 1 (31-03-2020)

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  • HAL Id : hal-02526142 , version 1

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Michel Kazan, Aurélien Bruyant, Gilles Lerondel. Analysis of the vibrational, structural and optical properties of SiC/Ge/Si heterostructures by means of infrared reflectivity: effect of Ge amount at the SiC/Si interface. The 7th Asia-Pacific Conference on Near-Field Optics, Nov 2009, Jeju, South Korea. ⟨hal-02526142⟩

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