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High accuracy optoelectronic control system for near field characterization of millimeter long wave guiding structures

Luc Chassagne 1 S. Topcu 1 Y. Alayli 1 Patrick Juncar 1 Gilles Lerondel 2 Sylvain Blaize 2 Aurélien Bruyant 2 Ilan Stefanon 2 Pascal Royer 2 
1 UVSQ - Université de Versailles Saint-Quentin-en-Yvelines
2 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
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https://hal-utt.archives-ouvertes.fr/hal-02521507
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Friday, March 27, 2020 - 2:54:29 PM
Last modification on : Sunday, June 26, 2022 - 4:45:40 AM

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Luc Chassagne, S. Topcu, Y. Alayli, Patrick Juncar, Gilles Lerondel, et al.. High accuracy optoelectronic control system for near field characterization of millimeter long wave guiding structures. Optical Metrology, Jun 2005, Munich, Germany. pp.585806, ⟨10.1117/12.611900⟩. ⟨hal-02521507⟩

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