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Conference papers
High accuracy optoelectronic control system for near field characterization of millimeter long wave guiding structures
Luc Chassagne
1
S. Topcu
1
Y. Alayli
1
P. Juncar
1
Gilles Lerondel
2
Sylvain Blaize
2
Aurélien Bruyant
2
Ilan Stefanon
2
Pascal Royer
2
2
LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
Luc Chassagne 1
Author IdHAL : luc-chassagne ORCID : https://orcid.org/0000-0003-4240-4591
S. Topcu 1
Author
Y. Alayli 1
Author
P. Juncar 1
Author
Gilles Lerondel 2
Author IdHAL : gilles-lerondel
Sylvain Blaize 2
Author
Aurélien Bruyant 2
Author
Ilan Stefanon 2
Author
Pascal Royer 2
Author
1
UVSQ - Université de Versailles Saint-Quentin-en-Yvelines (55 avenue de Paris - 78035 Versailles cedex - France)
2
LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique (12 rue Marie Curie - BP 2060 10010 TROYES CEDEX - France)
- ICD - Institut Charles Delaunay (12, rue Marie Curie BP 2060 - 10010 Troyes Cedex - France)
- UTT - Université de Technologie de Troyes (12 rue Marie Curie CS 42060 10004 TROYES CEDEX - France)
- CNRS - Centre National de la Recherche Scientifique : UMR6281 (France)
Document type :
Conference papers
Domain :
Complete list of metadatas
https://hal-utt.archives-ouvertes.fr/hal-02521507
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Friday, March 27, 2020 - 2:54:29 PM
Last modification on : Saturday, March 28, 2020 - 1:57:37 AM
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Friday, March 27, 2020 - 2:54:29 PM
Last modification on : Saturday, March 28, 2020 - 1:57:37 AM
Identifiers
- HAL Id : hal-02521507, version 1
- DOI : 10.1117/12.611900
Citation
Luc Chassagne, S. Topcu, Y. Alayli, P. Juncar, Gilles Lerondel, et al.. High accuracy optoelectronic control system for near field characterization of millimeter long wave guiding structures. Optical Metrology, Jun 2005, Munich, Germany. pp.585806, ⟨10.1117/12.611900⟩. ⟨hal-02521507⟩
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