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Gamma process with Gaussian noise applied on degradation and failure phenomenon

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Conference papers
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https://hal-utt.archives-ouvertes.fr/hal-02516718
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, March 24, 2020 - 8:39:54 AM
Last modification on : Wednesday, March 25, 2020 - 1:37:36 AM

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  • HAL Id : hal-02516718, version 1

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Khanh Le Son, Mitra Fouladirad, Anne Barros. Gamma process with Gaussian noise applied on degradation and failure phenomenon. CM 2011 and MFPT 2011 The Eighth International Conference on Condition Monitoring and Machinery Failure Prevention Technologies, Jun 2011, Cardiff, United States. ⟨hal-02516718⟩

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