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Communication Dans Un Congrès Année : 2011

Remaining useful life estimation based on probabilistic model

Résumé

Prognostic of system lifetime is a basic requirement for condition-based maintenance in many application domains where safety, reliability and availability are considered of first importance. This paper presents a probabilistic method for prognostic applied to the 2008 PHM conference Challenge data. A stochastic process (wiener process) combined with a data analysis method (Principal Component Analysis) is proposed to model the deterioration of the components and to estimate the RUL on a case study. The interest of our probabilistic approach is pointed out and a comparison with existing results on the same data is made.
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Dates et versions

hal-00633519 , version 1 (18-10-2011)

Identifiants

  • HAL Id : hal-00633519 , version 1

Citer

Khanh Le Son, Anne Barros, Mitra Fouladirad, Eric Levrat, Benoît Iung. Remaining useful life estimation based on probabilistic model. 17th ISSAT International Conference on Reliability and Quality in Design, Aug 2011, Vancouver, Canada. pp.10-25. ⟨hal-00633519⟩
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