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Phase and intensity contrast in apertureless Scanning near field optical microscopy

Aurélien Bruyant 1 Sébastien Aubert 2 Gilles Lerondel 1 Renaud Bachelot 1 Sylvain Hudlet 1 Pascal Royer 1 
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
2 IETR - Institut d'Électronique et des Technologies du numéRique
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Conference papers
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https://hal-utt.archives-ouvertes.fr/hal-02498951
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Wednesday, March 4, 2020 - 7:09:16 PM
Last modification on : Sunday, June 26, 2022 - 4:45:32 AM

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  • HAL Id : hal-02498951, version 1

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UNIV-NANTES | UNIV-RENNES1 | CNRS | INSA-RENNES | IETR | SUP_IETR | CENTRALESUPELEC | UR1-MATH-STIC | UR1-UFR-ISTIC | UNIV-RENNES | INSA-GROUPE | UTT | UR1-MATH-NUM | NANTES-UNIVERSITE

Citation

Aurélien Bruyant, Sébastien Aubert, Gilles Lerondel, Renaud Bachelot, Sylvain Hudlet, et al.. Phase and intensity contrast in apertureless Scanning near field optical microscopy. NFO7, Aug 2002, Rochester, United States. ⟨hal-02498951⟩

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