Error signal artifact in apertureless scanning near-fiel microcospy

Laurent Billot (1) , Marc Lamy de La Chapelle (2) , Dominique Barchiesi (1) , Pierre-Michel Adam (1) , Jean-Louis Bijeon (1) , Renaud Bachelot (1) , Pascal Royer (1) , Alexandre Bouhelier (3) , Shih-Hui Chang (4) , Stephen K. Gray (4) , Gary P. Wiederrecht (4) , John A Rogers (5)

1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
2 IMMM - Institut des Molécules et Matériaux du Mans
3 ICB - Laboratoire Interdisciplinaire Carnot de Bourgogne
4 ANL - Argonne National Laboratory [Lemont]
5 UIUC - University of Illinois at Urbana-Champaign [Urbana]

Domaines: Optique / photonique

Laurent Billot, Marc Lamy de La Chapelle, Dominique Barchiesi, Pierre-Michel Adam, Jean-Louis Bijeon, et al.. Error signal artifact in apertureless scanning near-fiel microcospy. NFO 9, Sep 2006, Lausanne, Switzerland. ⟨hal-02476596⟩