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Error signal artifact in apertureless scanning near-fiel microcospy

Laurent Billot 1 Marc Lamy de La Chapelle 2 Dominique Barchiesi 1 Pierre-Michel Adam 1 Jean-Louis Bijeon 1 Renaud Bachelot 1 Pascal Royer 1 Alexandre Bouhelier 3 Shih-Hui Chang 4 Stephen K. Gray 4 Gary P. Wiederrecht 4 John A Rogers 5 
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
2 IMMM - Institut des Molécules et Matériaux du Mans
3 ICB - Laboratoire Interdisciplinaire Carnot de Bourgogne
4 ANL - Argonne National Laboratory [Lemont]
5 University of Illinois at Urbana-Champaign [Urbana]
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Conference papers
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https://hal-utt.archives-ouvertes.fr/hal-02476596
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Wednesday, February 12, 2020 - 5:49:44 PM
Last modification on : Thursday, August 4, 2022 - 5:07:42 PM

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  • HAL Id : hal-02476596, version 1

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UNIV-BOURGOGNE | CNRS | UNIV-BM | UNIV-LEMANS | ICB | UNIV-BM-THESE | INC-CNRS | UTT | IMMM-LEMANS

Citation

Laurent Billot, Marc Lamy de La Chapelle, Dominique Barchiesi, Pierre-Michel Adam, Jean-Louis Bijeon, et al.. Error signal artifact in apertureless scanning near-fiel microcospy. NFO 9, Sep 2006, Lausanne, Switzerland. ⟨hal-02476596⟩

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