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Journal Articles physica status solidi (a) Year : 2007

Porous surface statistical characterization via fluorescence correlation spectroscopy

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Abstract

The characterization of the porosity or of the pore density is a very important issue for porous materials. We report on a new technique allowing a direct measure of the surface pore density. The number of pores on porous silicon substrates has been measured using fluorescence correlation spectroscopy, a technique that is generally applied in solution to study molecules diffusing through a small observation volume. This technique is used to measure the surface density of luminescent pores in a mesoscopic porous silicon layer.

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hal-02443562 , version 1 (17-01-2020)

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Jerome Plain, Rodolphe Jaffiol, Gilles Lerondel, Pascal Royer. Porous surface statistical characterization via fluorescence correlation spectroscopy. physica status solidi (a), 2007, 204 (5), pp.1507-1511. ⟨10.1002/pssa.200674404⟩. ⟨hal-02443562⟩

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