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Porous surface statistical characterization via fluorescence correlation spectroscopy

Abstract : The characterization of the porosity or of the pore density is a very important issue for porous materials. We report on a new technique allowing a direct measure of the surface pore density. The number of pores on porous silicon substrates has been measured using fluorescence correlation spectroscopy, a technique that is generally applied in solution to study molecules diffusing through a small observation volume. This technique is used to measure the surface density of luminescent pores in a mesoscopic porous silicon layer.
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Submitted on : Friday, January 17, 2020 - 11:39:40 AM
Last modification on : Friday, March 27, 2020 - 4:12:03 PM

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Jerome Plain, Rodolphe Jaffiol, Gilles Lerondel, Pascal Royer. Porous surface statistical characterization via fluorescence correlation spectroscopy. physica status solidi (a), Wiley, 2007, 204 (5), pp.1507-1511. ⟨10.1002/pssa.200674404⟩. ⟨hal-02443562⟩

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