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Journal articles
Porous surface statistical characterization via fluorescence correlation spectroscopy
Abstract : The characterization of the porosity or of the pore density is a very important issue for porous materials. We report on a new technique allowing a direct measure of the surface pore density. The number of pores on porous silicon substrates has been measured using fluorescence correlation spectroscopy, a technique that is generally applied in solution to study molecules diffusing through a small observation volume. This technique is used to measure the surface density of luminescent pores in a mesoscopic porous silicon layer.
https://hal-utt.archives-ouvertes.fr/hal-02443562
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, January 17, 2020 - 11:39:40 AM
Last modification on : Friday, March 27, 2020 - 4:12:03 PM
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, January 17, 2020 - 11:39:40 AM
Last modification on : Friday, March 27, 2020 - 4:12:03 PM
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