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Journal Articles Optics Express Year : 2008

Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry

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Abstract

The use of laser optical feedback Imaging (LOFI) for scattering-type scanning near-field optical microscopy (sSNOM) is proposed and investigated. We implement this sensitive imaging method by combining a sSNOM with optical heterodyne interferometry and the dynamic properties of a B class laser source which is here used both as source and detector. Compared with previous near field optical heterodyne experiments, this detection scheme provides an optical amplification that is several orders of magnitude higher, while keeping a low noise phase-sensitive detection. Successful demonstration of this complex field imaging technique is done on Silicon on Insulator (SOI) optical waveguides revealing phase singularities and directional leakage.

Dates and versions

hal-02440702 , version 1 (15-01-2020)

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Cite

Sylvain Blaize, Baptiste Bérenguier, Ilan Stefanon, Aurélien Bruyant, Gilles Lerondel, et al.. Phase sensitive optical near-field mapping using frequency-shifted laser optical feedback interferometry. Optics Express, 2008, 16 (16), pp.11718. ⟨10.1364/OE.16.011718⟩. ⟨hal-02440702⟩

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