Ohmic contact on single ZnO nanowires grown by MOCVD
Abstract
We present work on the fabrication and the characterization of ohmic contacts on single zinc oxide nanowires grown by metalorganic chemical vapour deposition. We demonstrate pre‐positionning of single nanowires before electronic‐beam lithography for 2 point metallic contacts. We characterize single nanowires by microphotoluminescence and by current‐voltage measurements. I–V results present a linear curve down to 1 mV with resistivities from 0.23 to 2.4 Ω ċ cm are measured, consistent with previous observation on ZnO nanowires.