Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope

Thomas Grosges (1) , Stephane Petit (1) , Dominique Barchiesi (1) , Sylvain Hudlet (1)

1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique

The electromagnetic field enhancement (FE) at the end of the probe of an Apertureless Scanning Near-field Optical Microscope (ASNOM) is used to write nanometric dots in a phase-change medium. The FE acts as a heat source that allows the transition from amorphous to crystalline phase in a Ge2Sb2Te5 layer. Through the 2D Finite Element Method (FEM) we predict the size of the dot as a function of both the illumination duration and the incoming power density. Numerical results are found to be in good agreement with preliminary experimental data.

Keywords: Diode lasers; Field enhancement; Laser beams; Laser sources; Near field scanning optical microscopy; Optical data storage

Domains: Engineering Sciences [physics]; Optics / Photonic

Thomas Grosges, Stephane Petit, Dominique Barchiesi, Sylvain Hudlet. Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope. Optics Express, 2004, 12 (24), pp.5987. ⟨10.1364/OPEX.12.005987⟩. ⟨hal-02437286⟩