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Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope

Abstract : The electromagnetic field enhancement (FE) at the end of the probe of an Apertureless Scanning Near-field Optical Microscope (ASNOM) is used to write nanometric dots in a phase-change medium. The FE acts as a heat source that allows the transition from amorphous to crystalline phase in a Ge2Sb2Te5 layer. Through the 2D Finite Element Method (FEM) we predict the size of the dot as a function of both the illumination duration and the incoming power density. Numerical results are found to be in good agreement with preliminary experimental data.
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https://hal-utt.archives-ouvertes.fr/hal-02437286
Contributor : Daniel Gavrysiak <>
Submitted on : Monday, January 13, 2020 - 4:47:40 PM
Last modification on : Tuesday, October 6, 2020 - 4:30:49 PM

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Thomas Grosges, Stephane Petit, Dominique Barchiesi, Sylvain Hudlet. Numerical modeling of the subwavelength phase-change recording using an apertureless scanning near-field optical microscope. Optics Express, Optical Society of America - OSA Publishing, 2004, 12 (24), pp.5987. ⟨10.1364/OPEX.12.005987⟩. ⟨hal-02437286⟩

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