Measurement of phonon damping by nanostructures

Abeer Al Mohtar (1, 2) , Aurélien Bruyant (2) , Serguei Kochtcheev (2) , Julien Vaillant (2) , A. Khoury (1) , Michel Kazan (3)

1 LPA - Laboratoire de Physique Appliquée
2 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
3 AUB - American University of Beirut [Beyrouth]

The understanding of phonon lifetime and scattering rates is attracting an increasing interest due to the major role of phonon in thermal and electrical conductivity which are key properties for technological applications. The infrared complex dielectric function of a crystal is determined by the harmonic characteristics of the phonon together with the intrinsic and extrinsic phonon scattering rates. In order to investigate the interplay between the phonon intrinsic scattering and the scattering of the phonon by a nanostructured surface, infrared reflectivity measurements from SiC nano-pyramids on SiC substrate have been analysed using a Kramers-Kronig conversion technique to deduce the infrared complex dielectric function. Then, the real and imaginary parts of the dielectric function were fitted simultaneously by using a theoretical model for the dielectric constant that considers frequency-dependent phonon damping at the center of the Brillouin zone. It has been found that surface nanostructuring strongly enhances the overall scattering rate of the phonon at the Brillouin zone center.

Domains: Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics

Abeer Al Mohtar, Aurélien Bruyant, Serguei Kochtcheev, Julien Vaillant, A. Khoury, et al.. Measurement of phonon damping by nanostructures. IOP Conference Series: Materials Science and Engineering, 2014, 68, pp.012001. ⟨10.1088/1757-899X/68/1/012001⟩. ⟨hal-02381637⟩