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Journal articles
Investigation of the correlation between dielectric function, thickness and morphology of nano-granular ZnO very thin films
Abstract : Thin nano-granular ZnO layers were prepared using a sol–gel synthesis and spin-coating deposition process with a thickness ranging between 20 and 120 nm. The complex dielectric function (ϵ) of the ZnO film was determined from spectroscopic ellipsometry measurements. Up to a critical thickness close to 60 nm, the magnitude of both the real and the imaginary parts of ϵ rapidly increases and then slowly tends to values closer to the bulk ZnO material. This trend suggests a drastic change in the film porosity at both sides of this critical thickness, due to the pre-heating and post-crystallization processes, as confirmed by additional characterization of the structure and the morphology of the ZnO films.
https://hal-utt.archives-ouvertes.fr/hal-02374069
Contributor : Daniel Gavrysiak Connect in order to contact the contributor
Submitted on : Thursday, November 21, 2019 - 12:57:17 PM
Last modification on : Thursday, October 14, 2021 - 1:10:13 PM
Contributor : Daniel Gavrysiak Connect in order to contact the contributor
Submitted on : Thursday, November 21, 2019 - 12:57:17 PM
Last modification on : Thursday, October 14, 2021 - 1:10:13 PM