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Heterodyne detection of guided waves using a scattering-type Scanning Near-Field Optical Microscope

Ilan Stefanon 1 Sylvain Blaize 1 Aurélien Bruyant 1 Sébastien Aubert 1 Gilles Lerondel 1 Renaud Bachelot 1 Pascal Royer 1
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
Abstract : An inherent problem to the study of waveguides with strong propagation losses by Scattering–type Scanning Near field Optical Microscopy is the coherent optical background field which disrupts strongly the weak detected near-field signal. We present a technique of heterodyne detection allowing us to overcome this difficulty while amplifying the near field signal. As illustrated in the case of highly confined Silicon on Isolator (SOI) structure, this technique, besides the amplitude, provides the local phase variation of the guided field. The knowledge of the complex field cartography leads to the modal analysis of the propagating radiation.
Keywords : Distributed feedback lasers In field scattering Near field scanning optical microscopy Polarization control Scanning electron microscopy Spatial frequency
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Journal articles
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https://hal-utt.archives-ouvertes.fr/hal-02351798
Contributor : Daniel Gavrysiak <>
Submitted on : Wednesday, November 6, 2019 - 3:24:04 PM
Last modification on : Tuesday, October 6, 2020 - 4:30:49 PM

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Ilan Stefanon, Sylvain Blaize, Aurélien Bruyant, Sébastien Aubert, Gilles Lerondel, et al.. Heterodyne detection of guided waves using a scattering-type Scanning Near-Field Optical Microscope. Optics Express, Optical Society of America - OSA Publishing, 2005, 13 (14), pp.5553. ⟨10.1364/OPEX.13.005553⟩. ⟨hal-02351798⟩

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