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Journal articles
Heterodyne detection of guided waves using a scattering-type Scanning Near-Field Optical Microscope
Abstract : An inherent problem to the study of waveguides with strong propagation losses by Scattering–type Scanning Near field Optical Microscopy is the coherent optical background field which disrupts strongly the weak detected near-field signal. We present a technique of heterodyne detection allowing us to overcome this difficulty while amplifying the near field signal. As illustrated in the case of highly confined Silicon on Isolator (SOI) structure, this technique, besides the amplitude, provides the local phase variation of the guided field. The knowledge of the complex field cartography leads to the modal analysis of the propagating radiation.
https://hal-utt.archives-ouvertes.fr/hal-02351798
Contributor : Daniel Gavrysiak Connect in order to contact the contributor
Submitted on : Wednesday, November 6, 2019 - 3:24:04 PM
Last modification on : Wednesday, September 15, 2021 - 3:03:22 PM
Contributor : Daniel Gavrysiak Connect in order to contact the contributor
Submitted on : Wednesday, November 6, 2019 - 3:24:04 PM
Last modification on : Wednesday, September 15, 2021 - 3:03:22 PM
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