Skip to Main content Skip to Navigation
Journal articles

Error signal artifact in apertureless scanning near-field optical microscopy

Laurent Billot 1 Marc Lamy de la Chapelle 1 Dominique Barchiesi 1 S.-H. Chang 2 S. Gray 2 J. Rogers 3 A. Bouhelier 2 Pierre-Michel Adam 1 Jean-Louis Bijeon 1 Gary P. Wiederrecht 2 Renaud Bachelot 1 Pascal Royer 1
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
2 University of Illinois at Urbana-Champaign [Urbana]
3 ANL - Argonne National Laboratory [Lemont]
Abstract : Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal.
Keywords : Optical imaging Atomic force microscopy Laser materials Finite-element analysis Transition metals Scanning probe microscopy Chemical elements Lasers Plasmonics Nano optics
Document type :
Journal articles
Complete list of metadatas
https://hal-utt.archives-ouvertes.fr/hal-02318693
Contributor : Daniel Gavrysiak <>
Submitted on : Thursday, October 17, 2019 - 12:40:10 PM
Last modification on : Friday, February 7, 2020 - 3:26:02 PM

Identifiers

Collections

CNRS | P2MN | UTT

Citation

Laurent Billot, Marc Lamy de la Chapelle, Dominique Barchiesi, S.-H. Chang, S. Gray, et al.. Error signal artifact in apertureless scanning near-field optical microscopy. Applied Physics Letters, American Institute of Physics, 2006, 89 (2), pp.023105. ⟨10.1063/1.2219134⟩. ⟨hal-02318693⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

21