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Conference papers
Enlarged sample holder for optical AFM imaging: Millimeter scanning with high resolution
Abstract : We developed a home-made sample-holder unit used for 2D nano-positioning with millimeter traveling ranges. For each displacement axis, the system includes a long range traveling stage and a piezoelectric actuator for accurate positioning. Specific electronics is integrated according to metrological considerations, enhancing the repeatability performances. The aim of this work is to demonstrate that near-field microscopy at the scale of a chip is possible. We chose here to characterize highly integrated optical structures. For this purpose, the sample-holder is integrated into an atomic force microscope in order to perform optical imaging. To demonstrate the overall performances, a millimeter scale optical images have been realized.
https://hal-utt.archives-ouvertes.fr/hal-02313791
Contributor : Daniel Gavrysiak Connect in order to contact the contributor
Submitted on : Friday, October 11, 2019 - 3:12:03 PM
Last modification on : Wednesday, September 15, 2021 - 3:04:09 PM
Contributor : Daniel Gavrysiak Connect in order to contact the contributor
Submitted on : Friday, October 11, 2019 - 3:12:03 PM
Last modification on : Wednesday, September 15, 2021 - 3:04:09 PM