Incidence angle calibration for prismless total internal reflection fluorescence microscopy

Dalia El Arawi 1 Marcelina Cardoso dos Santos 1, 2 Cyrille Vézy 1 Rodolphe Jaffiol 1
1 L2n - Lumière, nanomatériaux et nanotechnologies
ICD - Institut Charles Delaunay
2 NANO - NanoBioPhotonics
B3S - Département Biochimie, Biophysique et Biologie Structurale
Keywords : Atomic force microscopy Refractive index Laser sources High numerical aperture optics Electric fields Laser beams
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Journal articles
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https://hal-utt.archives-ouvertes.fr/hal-02311124
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Thursday, October 10, 2019 - 4:29:35 PM
Last modification on : Wednesday, December 4, 2019 - 10:58:01 AM

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Dalia El Arawi, Marcelina Cardoso dos Santos, Cyrille Vézy, Rodolphe Jaffiol. Incidence angle calibration for prismless total internal reflection fluorescence microscopy. Optics Letters, Optical Society of America, 2019, 44 (7), pp.1710. ⟨10.1364/OL.44.001710⟩. ⟨hal-02311124⟩

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