Incidence angle calibration for prismless total internal reflection fluorescence microscopy

Dalia El Arawi; Marcelina Cardoso dos Santos; Cyrille Vézy; Rodolphe Jaffiol

doi:10.1364/OL.44.001710

Journal articles

Incidence angle calibration for prismless total internal reflection fluorescence microscopy

Dalia El Arawi ¹ Marcelina Cardoso dos Santos ^{1, 2} Cyrille Vézy ¹ Rodolphe Jaffiol ¹

1 L2n - Lumière, nanomatériaux et nanotechnologies

ICD - Institut Charles Delaunay

2 NANO - NanoBioPhotonics

B3S - Département Biochimie, Biophysique et Biologie Structurale

Keywords : High numerical aperture optics Electric fields Laser beams Laser sources Atomic force microscopy Refractive index

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Optics / Photonic

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https://hal-utt.archives-ouvertes.fr/hal-02311124
Contributor : Jean-Baptiste VU VAN Connect in order to contact the contributor
Submitted on : Thursday, October 10, 2019 - 4:29:35 PM
Last modification on : Sunday, June 26, 2022 - 4:43:57 AM

Incidence angle calibration for prismless total internal reflection fluorescence microscopy

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Incidence angle calibration for prismless total internal reflection fluorescence microscopy

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