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Incidence angle calibration for prismless total internal reflection fluorescence microscopy

Dalia El Arawi 1 Marcelina Cardoso dos Santos 1, 2 Cyrille Vézy 1 Rodolphe Jaffiol 1
1 L2n - Lumière, nanomatériaux et nanotechnologies
ICD - Institut Charles Delaunay
2 NANO - NanoBioPhotonics
B3S - Département Biochimie, Biophysique et Biologie Structurale
Keywords : Atomic force microscopy Refractive index Laser sources High numerical aperture optics Electric fields Laser beams
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Journal articles
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https://hal-utt.archives-ouvertes.fr/hal-02311124
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Thursday, October 10, 2019 - 4:29:35 PM
Last modification on : Tuesday, October 6, 2020 - 4:26:41 PM

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CNRS | CEA | CEA-UPSAY | I2BC | CEA-DRF | P2MN | UTT | UNIV-PARIS-SACLAY | JOLIOT

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Dalia El Arawi, Marcelina Cardoso dos Santos, Cyrille Vézy, Rodolphe Jaffiol. Incidence angle calibration for prismless total internal reflection fluorescence microscopy. Optics Letters, Optical Society of America - OSA Publishing, 2019, 44 (7), pp.1710. ⟨10.1364/OL.44.001710⟩. ⟨hal-02311124⟩

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