Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope

Abstract : We describe how a commercial silicon cantilever can be used both as a force probe and a local scatterer of light. This tip can thus be used as the key element of an apertureless Scanning Near-field Optical Microscope (SNOM) combined with an Atomic Force Microscope (AFM). We use a Total Internal Reflection (TIR) illumination to provide a Fresnel evanescent wave with well-defined characteristics. We show how the weak signal issued from the near-field scattered by the tip can be extracted from the background noise. Finally we present how a signal related to the near field can also be obtained when the tip is oscillated at a frequency close to the resonance frequency of the cantilever. These results are compared with a simulation of the lock-in detection. Finally we describe the role of the vibration amplitude on the signal.
Document type :
Journal articles
Complete list of metadatas

https://hal-utt.archives-ouvertes.fr/hal-02301733
Contributor : Daniel Gavrysiak <>
Submitted on : Monday, September 30, 2019 - 4:21:14 PM
Last modification on : Tuesday, October 1, 2019 - 1:32:27 AM

Links full text

Identifiers

Collections

P2MN | UTT

Citation

Reda Laddada, Sakina Benrezzak, Pierre-Michel Adam, Geoffrey Viardot, Jean-Louis Bijeon, et al.. Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope. European Physical Journal: Applied Physics, EDP Sciences, 1999, 6 (2), pp.171-178. ⟨10.1051/epjap:1999168⟩. ⟨hal-02301733⟩

Share

Metrics

Record views

4