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Axial nanoscale localization by normalized total internal reflection fluorescence microscopy

Abstract : We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nanometric axial resolution, typically ≈10  nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.
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https://hal-utt.archives-ouvertes.fr/hal-02296396
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Submitted on : Wednesday, September 25, 2019 - 10:56:45 AM
Last modification on : Tuesday, October 6, 2020 - 4:26:41 PM

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Marcelina Cardoso dos Santos, Régis Déturche, Cyrille Vézy, Rodolphe Jaffiol. Axial nanoscale localization by normalized total internal reflection fluorescence microscopy. Optics Letters, Optical Society of America - OSA Publishing, 2014, 39 (4), pp.869. ⟨10.1364/OL.39.000869⟩. ⟨hal-02296396⟩

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