Axial nanoscale localization by normalized total internal reflection fluorescence microscopy

Abstract : We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nanometric axial resolution, typically ≈10  nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.
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https://hal-utt.archives-ouvertes.fr/hal-02296396
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Submitted on : Wednesday, September 25, 2019 - 10:56:45 AM
Last modification on : Thursday, September 26, 2019 - 1:26:06 AM

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Marcelina Cardoso dos Santos, Régis Déturche, Cyrille Vézy, Rodolphe Jaffiol. Axial nanoscale localization by normalized total internal reflection fluorescence microscopy. Optics Letters, Optical Society of America, 2014, 39 (4), pp.869. ⟨10.1364/OL.39.000869⟩. ⟨hal-02296396⟩

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