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Journal Articles Optics Letters Year : 2014

Axial nanoscale localization by normalized total internal reflection fluorescence microscopy

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Abstract

We present a simple modification of a standard total internal reflection fluorescence microscope to achieve nanometric axial resolution, typically ≈10  nm. The technique is based on a normalization of total internal reflection images by conventional epi-illumination images. We demonstrate the potential of our method to study the adhesion of phopholipid giant unilamellar vesicles.
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hal-02296396 , version 1 (25-09-2019)

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Marcelina Cardoso dos Santos, Régis Deturche, Cyrille Vézy, Rodolphe Jaffiol. Axial nanoscale localization by normalized total internal reflection fluorescence microscopy. Optics Letters, 2014, 39 (4), pp.869. ⟨10.1364/OL.39.000869⟩. ⟨hal-02296396⟩

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