Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling

Radouane Fikri 1 Thomas Grosges 1 Dominique Barchiesi 1
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
Abstract : In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.
Keywords : Scanning microscopy Electromagnetic optic Electric fields Field enhancement Nanopositioning equipment Near field optics Near field scanning optical microscopy Numerical simulation
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Journal articles
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https://hal-utt.archives-ouvertes.fr/hal-02295977
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Submitted on : Tuesday, September 24, 2019 - 4:27:47 PM
Last modification on : Wednesday, September 25, 2019 - 1:29:02 AM

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Radouane Fikri, Thomas Grosges, Dominique Barchiesi. Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling. Optics Letters, Optical Society of America, 2003, 28 (22), pp.2147. ⟨10.1364/OL.28.002147⟩. ⟨hal-02295977⟩

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