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Journal Articles Optics Letters Year : 2003

Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling

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Abstract

In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.
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hal-02295977 , version 1 (24-09-2019)

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Radouane Fikri, Thomas Grosges, Dominique Barchiesi. Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling. Optics Letters, 2003, 28 (22), pp.2147. ⟨10.1364/OL.28.002147⟩. ⟨hal-02295977⟩

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