Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Pierre-Michel Adam 1 Pascal Royer 1 Reda Laddada 1 Jean-Louis Bijeon 1
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
Abstract : We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.
Keywords : Apertures Image analysis Microscopy Scanning microscopy Polarization
Document type :
Journal articles
Complete list of metadatas
https://hal-utt.archives-ouvertes.fr/hal-02292898
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, September 20, 2019 - 12:36:06 PM
Last modification on : Friday, February 7, 2020 - 3:26:02 PM

Identifiers

Collections

CNRS | P2MN | UTT

Citation

Pierre-Michel Adam, Pascal Royer, Reda Laddada, Jean-Louis Bijeon. Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast. Applied optics, Optical Society of America, 1998, 37 (10), pp.1814. ⟨10.1364/AO.37.001814⟩. ⟨hal-02292898⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

21

Contact

Informations

CCSD