Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast - Université de technologie de Troyes Access content directly
Journal Articles Applied optics Year : 1998

Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Abstract

We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.
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Dates and versions

hal-02292898 , version 1 (20-09-2019)

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Pierre-Michel Adam, Pascal Royer, Reda Laddada, Jean-Louis Bijeon. Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast. Applied optics, 1998, 37 (10), pp.1814. ⟨10.1364/AO.37.001814⟩. ⟨hal-02292898⟩

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