Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Pierre-Michel Adam; Pascal Royer; Reda Laddada; Jean-Louis Bijeon

Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Pierre-Michel Adam ¹ Pascal Royer ¹ Reda Laddada ¹ Jean-Louis Bijeon ¹

1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique

ICD - Institut Charles Delaunay

Abstract : We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.

Keywords : Apertures Image analysis Microscopy Scanning microscopy Polarization

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Optics / Photonic

Complete list of metadatas

https://hal-utt.archives-ouvertes.fr/hal-02292898
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, September 20, 2019 - 12:36:06 PM
Last modification on : Saturday, September 21, 2019 - 1:29:10 AM

Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Identifiers

Collections

Citation

Export

Metrics

11

Contact

Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast

Identifiers

Collections

Citation

Export

Share

Metrics

11

Contact