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Journal Articles Optical Engineering Year : 1998

Apertureless near-field optical microscope in reflection and transmission modes

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Abstract

Apertureless scanning near-field optical microscope (SNOM) receives an increasing interest in local imaging and analysis. We report a hybrid microscope composed of a commercial atomic force microscope (AFM) and an apertureless SNOM, which operates both in reflection and transmission modes with several illumination and collection systems. The optical probe is a commercial AFM tip integrated on a silicon cantilever. The AFM is operated in the intermittent contact mode at the resonance frequency of the cantilever. We present the images obtained on a grating of cylindrical dots of aluminum and we show the effects of some optical parameters on the SNOM images.
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hal-02292680 , version 1 (20-09-2019)

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Reda Laddada, Pierre-Michel Adam, Pascal Royer, Jean-Louis Bijeon. Apertureless near-field optical microscope in reflection and transmission modes. Optical Engineering, 1998, 37 (7), pp.2142. ⟨10.1117/1.601720⟩. ⟨hal-02292680⟩

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