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Conference papers
Time-frequency analysis of near-field optical data for extracting local attributes
Abstract : Near-field microscopy has been developed to characterize optical properties of materials below the diffraction limit. It consists of scanning a probe, which can be of atomic dimensions, a few nanometers above a material surface, and detecting electromagnetic interaction. The resulting near-field optical images are conventionally analyzed by means of Fourier-based methods although these data are nonstationary. This observation suggests that time frequency analysis is potentially a powerful tool for extracting attributes such as local resolution of near-field optical microscopes. We use bilinear time-frequency distributions and their optimized version by the AOK procedure to analyze experimental near-field optical and magneto-optical raw images. We show that this approach allows local characterization of optical resolution and separation of relevant optical information from artifacts caused by the scanning probe recording process.
https://hal-utt.archives-ouvertes.fr/hal-02286039
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, September 13, 2019 - 12:50:36 PM
Last modification on : Monday, September 16, 2019 - 4:35:52 PM
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, September 13, 2019 - 12:50:36 PM
Last modification on : Monday, September 16, 2019 - 4:35:52 PM