Time-frequency analysis of near-field optical data for extracting local attributes

Dominique Barchiesi 1 Cédric Richard 2
1 LNIO - Laboratoire de Nanotechnologie et d'Instrumentation Optique
ICD - Institut Charles Delaunay
2 LM2S - Laboratoire Modélisation et Sûreté des Systèmes
ICD - Institut Charles Delaunay
Abstract : Near-field microscopy has been developed to characterize optical properties of materials below the diffraction limit. It consists of scanning a probe, which can be of atomic dimensions, a few nanometers above a material surface, and detecting electromagnetic interaction. The resulting near-field optical images are conventionally analyzed by means of Fourier-based methods although these data are nonstationary. This observation suggests that time frequency analysis is potentially a powerful tool for extracting attributes such as local resolution of near-field optical microscopes. We use bilinear time-frequency distributions and their optimized version by the AOK procedure to analyze experimental near-field optical and magneto-optical raw images. We show that this approach allows local characterization of optical resolution and separation of relevant optical information from artifacts caused by the scanning probe recording process.
Document type :
Conference papers
Complete list of metadatas
https://hal-utt.archives-ouvertes.fr/hal-02286039
Contributor : Daniel Gavrysiak <>
Submitted on : Friday, September 13, 2019 - 12:50:36 PM
Last modification on : Monday, September 16, 2019 - 4:35:52 PM

Identifiers

Collections

ROSAS | P2MN | UTT

Citation

Dominique Barchiesi, Cédric Richard. Time-frequency analysis of near-field optical data for extracting local attributes. 2001 IEEE International Conference on Acoustics, Speech, and Signal Processing. Proceedings, May 2001, Salt Lake City, United States. pp.3565-3568, ⟨10.1109/ICASSP.2001.940612⟩. ⟨hal-02286039⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

8

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD