Scanning near-field optical microscopy signal processing and resolution - Archive ouverte HAL Access content directly
Journal Articles Applied optics Year : 2007

Scanning near-field optical microscopy signal processing and resolution

(1) , (1)
1

Abstract

To increase the signal-to-noise ratio and to remove the spatially slow varying signals, a lock-in amplifier is often used in scanning probe microscopy. The signal reconstructed from the lock-in data contains the contributions of the evanescent and homogeneous waves that are mixed in the near-field zone (i.e., at a very short distance). The resolution is determined and a method is given to suppress the useless background information. Experimental images of nanoparticles are processed.
Not file

Dates and versions

hal-02285448 , version 1 (12-09-2019)

Identifiers

Cite

Thomas Grosges, Dominique Barchiesi. Scanning near-field optical microscopy signal processing and resolution. Applied optics, 2007, 46 (12), pp.2248. ⟨10.1364/AO.46.002248⟩. ⟨hal-02285448⟩

Collections

CNRS UTT
10 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More