Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering

Hui Sun (1) , Mohammad Arab Pour Yazdi (1) , Cedric Ducros (2) , Sheng-Chi Chen (3) , Eric Aubry (1) , Chao-Kuang Wen (4) , Jang-Hsing Hsieh , Frédéric Sanchette (5) , Alain Billard (1)

1 FEMTO-ST - Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174)
2 LITEN - Laboratoire d'Innovation pour les Technologies des Energies Nouvelles et les nanomatériaux
3 Chang Gung University
4 NTU - National Taiwan University [Taiwan]
5 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée

Domains: Engineering Sciences [physics]; Mechanics [physics.med-ph]; Mechanics of materials [physics.class-ph]; Engineering Sciences [physics]; Acoustics [physics.class-ph]; Engineering Sciences [physics]; Materials; Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics

Hui Sun, Mohammad Arab Pour Yazdi, Cedric Ducros, Sheng-Chi Chen, Eric Aubry, et al.. Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering. Materials Science in Semiconductor Processing, 2017, 63, pp.295-302. ⟨10.1016/j.mssp.2017.03.002⟩. ⟨hal-02283301⟩