Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering - Archive ouverte HAL Access content directly
Journal Articles Materials Science in Semiconductor Processing Year : 2017

Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering

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hal-02283301 , version 1 (10-09-2019)

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Hui Sun, Mohammad Arab Pour Yazdi, Cedric Ducros, Sheng-Chi Chen, Eric Aubry, et al.. Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering. Materials Science in Semiconductor Processing, 2017, 63, pp.295-302. ⟨10.1016/j.mssp.2017.03.002⟩. ⟨hal-02283301⟩
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