Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering

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https://hal-utt.archives-ouvertes.fr/hal-02283301
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Submitted on : Tuesday, September 10, 2019 - 4:29:38 PM
Last modification on : Monday, September 16, 2019 - 4:35:59 PM

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Hui Sun, Mohammad Arab Pour Yazdi, Cedric Ducros, Sheng-Chi Chen, Eric Aubry, et al.. Thickness-dependent optoelectronic properties of CuCr 0.93 Mg 0.07 O 2 thin films deposited by reactive magnetron sputtering. Materials Science in Semiconductor Processing, Elsevier, 2017, 63, pp.295-302. ⟨10.1016/j.mssp.2017.03.002⟩. ⟨hal-02283301⟩

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