Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

Bruno Guelorget (1) , Manuel François (1) , Cristián Vial-Edwards (2) , Guillaume Montay (1) , Laurent Daniel (1) , Jian Lu (1)

1 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée
2 UC - Pontificia Universidad Católica de Chile

Domaines: Mécanique des matériaux [physics.class-ph]

Bruno Guelorget, Manuel François, Cristián Vial-Edwards, Guillaume Montay, Laurent Daniel, et al.. Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset. Materials Science and Engineering: A, 2006, 415 (1-2), pp.234-241. ⟨10.1016/j.msea.2005.09.090⟩. ⟨hal-02282871⟩