Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

Bruno Guelorget; Manuel François; Cristián Vial-Edwards; Guillaume Montay; Laurent Daniel; Jian Lu

doi:10.1016/j.msea.2005.09.090

Journal articles

Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

Bruno Guelorget ¹ Manuel François ¹ Cristián Vial-Edwards ² Guillaume Montay ¹ Laurent Daniel ¹ Jian Lu ¹

1 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée

ICD - Institut Charles Delaunay

2 UC - Pontificia Universidad Católica de Chile

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Mechanics [physics.med-ph] / Mechanics of materials [physics.class-ph]

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https://hal-utt.archives-ouvertes.fr/hal-02282871
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Submitted on : Tuesday, September 10, 2019 - 12:01:21 PM
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Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

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Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

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