Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset - Université de technologie de Troyes Access content directly
Journal Articles Materials Science and Engineering: A Year : 2006

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hal-02282871 , version 1 (10-09-2019)

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Bruno Guelorget, Manuel François, Cristián Vial-Edwards, Guillaume Montay, Laurent Daniel, et al.. Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset. Materials Science and Engineering: A, 2006, 415 (1-2), pp.234-241. ⟨10.1016/j.msea.2005.09.090⟩. ⟨hal-02282871⟩

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