Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset - Archive ouverte HAL Access content directly
Journal Articles Materials Science and Engineering: A Year : 2006

Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset

(1) , (1) , (2) , (1) , (1) , (1)
1
2

Domains

Engineering Sciences [physics] Mechanics [physics.med-ph] Mechanics of materials [physics.class-ph]

Jean-Baptiste VU VAN  : Connect in order to contact the contributor

https://hal-utt.archives-ouvertes.fr/hal-02282871

Submitted on : Tuesday, September 10, 2019-12:01:21 PM

Last modification on : Sunday, June 26, 2022-4:47:58 AM

Consult the full text

Dates and versions

hal-02282871 , version 1 (10-09-2019)

Identifiers

Cite

Bruno Guelorget, Manuel François, Cristián Vial-Edwards, Guillaume Montay, Laurent Daniel, et al.. Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset. Materials Science and Engineering: A, 2006, 415 (1-2), pp.234-241. ⟨10.1016/j.msea.2005.09.090⟩. ⟨hal-02282871⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

CNRS UTT
11 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More