Bruno Guelorget, Manuel François, Cristián Vial-Edwards, Guillaume Montay, Laurent Daniel, et al.. Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset.
Materials Science and Engineering: A, Elsevier, 2006, 415 (1-2), pp.234-241.
⟨10.1016/j.msea.2005.09.090⟩.
⟨hal-02282871⟩