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Journal articles
Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset
Bruno Guelorget
1
Manuel Francois
1
Cristián Vial-Edwards
2
Guillaume Montay
1
Laurent Daniel
1
Jian Lu
1
1
LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée
ICD - Institut Charles Delaunay
Bruno Guelorget 1
Author
Manuel Francois 1
Author
Cristián Vial-Edwards 2
Author
Guillaume Montay 1
Author
Laurent Daniel 1
Author IdHAL : laurent-daniel-utt ORCID : https://orcid.org/0000-0002-2999-7671
Jian Lu 1
Author Employer institution : The Hong Kong Polytechnic University [Hong Kong]
1
LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée (12 rue Marie Curie - BP 2060 10010 TROYES CEDEX - France)
- ICD - Institut Charles Delaunay (12, rue Marie Curie BP 2060 - 10010 Troyes Cedex - France)
- CNRS - Centre National de la Recherche Scientifique : UMR6281 (France)
- UTT - Université de Technologie de Troyes (12 rue Marie Curie CS 42060 10004 TROYES CEDEX - France)
2
UC - Pontificia Universidad Católica de Chile (Casilla 306, Santiago 22 - Chile)
Document type :
Journal articles
Complete list of metadata
https://hal-utt.archives-ouvertes.fr/hal-02282871
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, September 10, 2019 - 12:01:21 PM
Last modification on : Wednesday, May 20, 2020 - 9:26:04 AM
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, September 10, 2019 - 12:01:21 PM
Last modification on : Wednesday, May 20, 2020 - 9:26:04 AM
Identifiers
- HAL Id : hal-02282871, version 1
- DOI : 10.1016/j.msea.2005.09.090
Citation
Bruno Guelorget, Manuel Francois, Cristián Vial-Edwards, Guillaume Montay, Laurent Daniel, et al.. Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset. Materials Science and Engineering: A, Elsevier, 2006, 415 (1-2), pp.234-241. ⟨10.1016/j.msea.2005.09.090⟩. ⟨hal-02282871⟩
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