https://hal-utt.archives-ouvertes.fr/hal-02282871
Contributor : Jean-Baptiste Vu Van
<>
Submitted on : Tuesday, September 10, 2019 - 12:01:21 PM
Last modification on : Monday, September 16, 2019 - 4:36:04 PM
Bruno Guelorget, Manuel François, Cristián Vial-Edwards, Guillaume Montay, Laurent Daniel, et al.. Strain rate measurement by Electronic Speckle Pattern Interferometry: A new look at the strain localization onset. Materials Science and Engineering: A, Elsevier, 2006, 415 (1-2), pp.234-241. ⟨10.1016/j.msea.2005.09.090⟩. ⟨hal-02282871⟩
