Strain localization band width evolution by electronic speckle pattern interferometry strain rate measurement

Bruno Guelorget (1) , Manuel François (1) , Guillaume Montay (1)

1 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée

In this paper, electronic speckle pattern interferometry strain rate measurements are used to quantify the width of the strain localization band, which occurs when a sheet specimen is submitted to tension. It is shown that the width of this band decreases with increasing strain. Just before fracture, this measured width is about five times wider than the shear band and the initial sheet thickness.

Domains: Engineering Sciences [physics]; Mechanics [physics.med-ph]; Mechanics of materials [physics.class-ph]

Bruno Guelorget, Manuel François, Guillaume Montay. Strain localization band width evolution by electronic speckle pattern interferometry strain rate measurement. Scripta Materialia, 2009, 60 (8), pp.647-650. ⟨10.1016/j.scriptamat.2008.12.036⟩. ⟨hal-02282673⟩