Strain localization band width evolution by electronic speckle pattern interferometry strain rate measurement

Abstract : In this paper, electronic speckle pattern interferometry strain rate measurements are used to quantify the width of the strain localization band, which occurs when a sheet specimen is submitted to tension. It is shown that the width of this band decreases with increasing strain. Just before fracture, this measured width is about five times wider than the shear band and the initial sheet thickness.
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https://hal-utt.archives-ouvertes.fr/hal-02282673
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Submitted on : Tuesday, September 10, 2019 - 11:01:35 AM
Last modification on : Monday, September 16, 2019 - 4:35:58 PM

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Bruno Guelorget, Manuel François, Guillaume Montay. Strain localization band width evolution by electronic speckle pattern interferometry strain rate measurement. Scripta Materialia, Elsevier, 2009, 60 (8), pp.647-650. ⟨10.1016/j.scriptamat.2008.12.036⟩. ⟨hal-02282673⟩

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