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Journal articles
Strain localization band width evolution by electronic speckle pattern interferometry strain rate measurement
Abstract : In this paper, electronic speckle pattern interferometry strain rate measurements are used to quantify the width of the strain localization band, which occurs when a sheet specimen is submitted to tension. It is shown that the width of this band decreases with increasing strain. Just before fracture, this measured width is about five times wider than the shear band and the initial sheet thickness.
https://hal-utt.archives-ouvertes.fr/hal-02282673
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, September 10, 2019 - 11:01:35 AM
Last modification on : Wednesday, May 20, 2020 - 9:26:04 AM
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Tuesday, September 10, 2019 - 11:01:35 AM
Last modification on : Wednesday, May 20, 2020 - 9:26:04 AM
