Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, et al.. Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations.
Chinese Optics Letters, Optical Society of America (imprimé) / OSA publishing (en ligne), 2018, 16 (7), pp.071201.
⟨10.3788/COL201816.071201⟩.
⟨hal-02282569⟩