Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu 1 Julien Vaillant 1 Guillaume Montay 2 Manuel Francois 2 Yassine Hadjar 1 Aurélien Bruyant 1
1 L2n - Lumière, nanomatériaux et nanotechnologies
ICD - Institut Charles Delaunay
2 LASMIS - Laboratoire des Systèmes Mécaniques et d'Ingénierie Simultanée
ICD - Institut Charles Delaunay
Abstract : Electronic speckle pattern interferometry (ESPI) and digital speckle pattern interferometry are well-established non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional (2D) or three-dimensional (3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a high-speed camera.
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Journal articles
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https://hal-utt.archives-ouvertes.fr/hal-02282569
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Submitted on : Tuesday, September 10, 2019 - 10:17:53 AM
Last modification on : Friday, November 15, 2019 - 2:00:03 PM

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Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel Francois, Yassine Hadjar, et al.. Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations. Chinese Optics Letters, Optical Society of America (imprimé) / OSA publishing (en ligne), 2018, 16 (7), pp.071201. ⟨10.3788/COL201816.071201⟩. ⟨hal-02282569⟩

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