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Generation of Extremely High Stress Levels in a TiAl Based Alloy

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https://hal-utt.archives-ouvertes.fr/hal-02278201
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Wednesday, September 4, 2019 - 10:58:40 AM
Last modification on : Wednesday, May 20, 2020 - 9:26:04 AM

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C. Pilé, Delphine Retraint, Manuel Francois, Jian Lu. Generation of Extremely High Stress Levels in a TiAl Based Alloy. Materials Science Forum, Trans Tech Publications Inc., 2002, 404-407, pp.89-94. ⟨10.4028/www.scientific.net/MSF.404-407.89⟩. ⟨hal-02278201⟩

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