Journal Articles
Materials Science Forum
Year : 2002
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https://hal-utt.archives-ouvertes.fr/hal-02278201
Submitted on : Wednesday, September 4, 2019-10:58:40 AM
Last modification on : Friday, March 24, 2023-2:53:12 PM
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- HAL Id : hal-02278201 , version 1
- DOI : 10.4028/www.scientific.net/MSF.404-407.89
Cite
C. Pilé, Delphine Retraint, Manuel François, Jian Lu. Generation of Extremely High Stress Levels in a TiAl Based Alloy. Materials Science Forum, 2002, 404-407, pp.89-94. ⟨10.4028/www.scientific.net/MSF.404-407.89⟩. ⟨hal-02278201⟩
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