All-fiber reflection-based scattering NSOM with low phase drift for guided-wave imaging on a chip

Abstract : An all-fiber phase-resolved reflection-based near-field scanning optical microscope with a phase-drift-rate of 0.06°/s is developed. By raster scanning atomic force microscope probe, we measure the complex near-fields and analyse the standing-wave-spectrograms in silicon nano-waveguides.
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Conference papers
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https://hal-utt.archives-ouvertes.fr/hal-02270607
Contributor : Jean-Baptiste Vu Van <>
Submitted on : Monday, August 26, 2019 - 9:56:58 AM
Last modification on : Monday, September 16, 2019 - 4:36:10 PM

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Yi-Zhi Sun, Bin-Bin Wang, Rafael Salas-Montiel, Sylvain Blaize, Renaud Bachelot, et al.. All-fiber reflection-based scattering NSOM with low phase drift for guided-wave imaging on a chip. Conference on Lasers and Electro-Optics (2019), May 2019, San Jose, United States. pp.SM2H.7, ⟨10.1364/CLEO_SI.2019.SM2H.7⟩. ⟨hal-02270607⟩

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